Feature workflows

Five ways Quick-S shortens SI review work.

Quick-S is built for Windows 10/11 x64 desktop workflows. The first public package focuses on fast measured-data review, repeatable report generation, SNP operations, fixture de-embedding, DC IR layout estimates, COM/IBIS-AMI debug, and flexible customer-ready reports.

01 2-Step Results Import files, then plot IL, RL, TDR, TDT, impedance, and RLGC. 02 5-Step Reports Reuse files, configs, limit lines, and report layouts across high-port workflows. 03 SNP Workspace Reorder ports, extract channels, cascade networks, run fixture de-embedded workflows, and compare measured data. 04 Engineering Pre-Check Use S4P Adjust, simplified eye/channel checks, IEEE COM 4.15 runs, limited IBIS/AMI debug, IBIS-AMI templates, DC IR Drop, and transmission-line S4P generation. 05 Custom Reports Build flexible pages with 1 to 4 plots and the views reviewers need.

01 / Fast review

2-Step Results: import, then plot.

Quick-S keeps quick inspection simple. Import Touchstone files and plot immediately to review measured data quality without first building a report setup.

Compare insertion loss and return loss across multiple measured sources.
Switch between frequency-domain and time-domain views for IL, RL, TDR, TDT, and impedance.
Use RLGC views to understand loss and transmission-line behavior earlier in review.

Fast frequency-domain plotting

02 / Repeatable reporting

5-Step Report Generation for repeated work.

For recurring reviews, Quick-S reduces the tedious setup work: pin definitions, line style, plot layout, and report settings can be reused instead of rebuilt every time.

Workflow: import files, import configs, import limit lines, import report configs, then generate.
Designed for all supported SNP review patterns, from small files to dense high-port measurements.
Useful when only the measured SNP files change, but the reporting structure stays the same.

03 / SNP workspace

One simple UI for common SNP operations.

Quick-S gathers the work normally scattered across small utilities into one desktop surface for Touchstone analysis and cleanup.

Reorder ports for standard differential or custom mappings.
Extract useful channel subsets from larger SNP files.
Cascade channel blocks, run fixture de-embedded workflows, and compare the resulting response in the same workspace.

04 / Engineering pre-check

Engineering pre-check tools for what-if and debug.

Quick-S includes S4P Adjust, simplified eye/channel checks, IEEE COM 4.15 helpers, DC IR layout estimates, Reference S4P generation, and IBIS-AMI template tools that help engineers reason about S-parameter and layout data during early debug.

Use S4P Adjust for stackup, geometry, length, material, conductivity, and copper roughness trend comparison on base S4P data.
Generate simplified NRZ/PAM4 eye diagrams with reference TX/RX behavior, simplified IBIS extraction, limited IBIS-AMI/DLL debug, AMI parameter sweep logs, and IEEE COM 4.15 batch runs.
Use DC IR Drop with ODB++ layout import for first-pass rail DCR and voltage-drop estimates alongside de-embedding previews, Reference S4P generation, and IBIS-AMI Template packages.

Channel simulation and IBIS/AMI pre-check

05 / Report layout

Highly customizable SI reports.

Quick-S reports can be shaped around the review task instead of forcing every result into one fixed layout.

Control report pages and place 1 to 4 plots on each data page.
Include IL, RL, VSWR, Smith chart, phase, group delay, TDR, TDT, RLGC, and reference eye diagram results.
Add limit-line evidence and consistent styling for customer or team review packages.

Product screenshots

Real Quick-S workflows, not placeholder diagrams.

These views show current desktop UI work for high-port import, markers, cascade/channel simulation, COM, parametric exploration, and DC IR.

High-port Touchstone import

Select lanes from dense S32P data and keep review setup repeatable.

Dense plot inspection

Use markers and single-marker labels to inspect crowded high-port results.

IBIS-AMI channel setup

Configure TX/RX sources, AMI files, channel outputs, and eye/debug views.

IEEE COM helper

Run COM helper flows from the same advanced workflow surface.

Parametric channel result

Compare base and target stackup trends from a repeatable configuration.

DC IR heatmap

Review layout-based voltage drop and current-density estimates.

Engineering pre-check scope: Channel Sim, Eye Diagram, DC IR Drop, S4P Adjust, generated S4P models, COM helpers, and IBIS-AMI Template packages use simplified behavioral, rasterized sheet, or transmission-line models. They are intended for trend comparison, sanity checks, and debug workflows, not as replacements for 2.5D/3D EM solvers, independently qualified detailed analysis, measurement validation, qualified model delivery, or final sign-off.

Preparing for evaluation